Intelligent Learning Engine of Defects (ILED)
ILED is a tool for calculating defect properties based on density functional theory and machine-learning interatomic potentials.
Reliability Ab-initio Simulation Package (RASP)
RASP is a tool for simulating MOSFET reliability based on defect parameters obtained from first principles.
Analysis of Defect Spectroscopy (ADS)
ADS is a tool for fitting experimental DLTS results based on nonradiative multiphonon theory.
TCAD Workshop
Workshop information and training schedule for semiconductor defect simulation and TCAD software.