Semiconductor Research Platform

A unified
platform entry point
for defect research tools

Semiconductor Defect Hub brings together three defect-research software systems under one platform layer for identity, navigation, and future module access.

3
Research Modules
1
Shared Account System
SMTP
Email Verification
Hub
Platform Aggregation Layer
01 ยท Modules

One platform, three research tools

The platform layer does not merge all business logic into one codebase. It provides identity, presentation, and navigation while each research tool continues to evolve independently.

Software 01

Intelligent Learning Engine of Defects (ILED)

An intelligent learning engine for defect research, built to support data-driven learning, knowledge extraction, and advanced analysis workflows.

Software 02

Reliability Ab-initio Simulation Package (RASP)

An ab-initio reliability simulation package for defect-related modeling, device simulation, and computational research workflows.

Software 03

Analysis of Defect Spectroscopy (ADS)

A spectroscopy analysis environment for DLTS, admittance spectroscopy, and related defect-spectrum fitting and interpretation.